emerging nanotechnologies
| |
emerging nanotechnologies
|
soft errors in modern electronic systems
| |
soft errors in modern electronic systems
|
essentials of electronic testing for...
| |
essentials of electronic testing for digital, memory, and mixed-signal vlsi circuits
|
verification by error modeling
| |
verification by error modeling
|
designer's guide to built-in self-test
| |
designer's guide to built-in self-test
|
iddq testing of vlsi circuits /
| |
iddq testing of vlsi circuits /
|
verification by error modeling :
| |
verification by error modeling :
|
power-constrained testing of vlsi ci...
| |
power-constrained testing of vlsi circuits
|
introduction to advanced system-on-c...
| |
introduction to advanced system-on-chip test design and optimization
|
high performance memory testing
| |
high performance memory testing
|
essentials of electronic testing for...
| |
essentials of electronic testing for digital, memory, and mixed-signal vlsi circuits /
|
fault diagnosis of analog integrated...
| |
fault diagnosis of analog integrated circuits
|
high performance memory testing
| |
high performance memory testing
|
designer's guide to built-in self-test
| |
designer's guide to built-in self-test
|
fault injection techniques and tools...
| |
fault injection techniques and tools for embedded systems reliability evaluation
|
timing performance of nanometer digi...
| |
timing performance of nanometer digital circuits under process variations
|
new methods of concurrent checking
| |
new methods of concurrent checking
|
design for at-speed test, diagnosis,...
| |
design for at-speed test, diagnosis, and measurement
|
boundary-scan interconnect diagnosis
| |
boundary-scan interconnect diagnosis
|
essentials of electronic testing for...
| |
essentials of electronic testing for digital, memory, and mixed-signal vlsi circuits
|