Leach, Richard.
Overview
| Works: | 1 works in 2 publications in 1 languages | |
|---|---|---|
Titles
Optical measurement of surface topography
by:
Leach, Richard.; SpringerLink (Online service)
(Electronic resources)
Characterisation of areal surface texture
by:
Leach, Richard.; SpringerLink (Online service)
(Electronic resources)
Industrial X-ray computed tomography
by:
Carmignato, Simone.; Dewulf, Wim.; Leach, Richard.; SpringerLink (Online service)
(Electronic resources)
Subjects
Microwaves, RF and Optical Engineering.
Manufacturing, Machines, Tools.
Surfaces (Technology)- Testing.
Characterization and Analytical Technique.
Surfaces and Interfaces, Thin Films.
Tomography- Industrial applications.
Surfaces (Technology)- Analysis.
Materials Science.
Measurement Science and Instrumentation.
Atomic, Molecular, Optical and Plasma Physics.
Surface and Interface and Thin Film.
Characterization and Evaluation of Materials.
Optical and Electronic Materials.
Surfaces (Physics)
Surfaces, Interfaces and Thin Film.
Surfaces (Technology)- Optical properties.