Peng, Xihong.
概要
| 作品: | 1 作品在 0 項出版品 0 種語言 | |
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書目資訊
First principles study of size and strain effects on the electronic properties of silicon and silicon carbide nanostructures.
by:
Peng, Xihong.; Rensselaer Polytechnic Institute.
(書目-語言資料,印刷品)