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Adaptation of intermittent contact m...

Chan, Sandra Suk Fung.

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Adaptation of intermittent contact modes to inverted atomic force microscopy.

紀錄類型:	書目-電子資源 : Monograph/item
正題名/作者:	Adaptation of intermittent contact modes to inverted atomic force microscopy./
作者:	Chan, Sandra Suk Fung.
面頁冊數:	104 p.
附註:	Source: Masters Abstracts International, Volume: 44-03, page: 1363.
Contained By:	Masters Abstracts International44-03.
標題:	Chemistry, General. -
電子資源:	http://pqdd.sinica.edu.tw/twdaoapp/servlet/advanced?query=MR09137
ISBN:	9780494091371

Adaptation of intermittent contact modes to inverted atomic force microscopy.
Chan, Sandra Suk Fung.

Adaptation of intermittent contact modes to inverted atomic force microscopy. - 104 p.

Source: Masters Abstracts International, Volume: 44-03, page: 1363.

Thesis (M.Sc.)--University of Alberta (Canada), 2005.

This work is aimed at evaluating the plausibility of using atomic force microcopy (AFM) instrumentation and techniques for the measurement of interaction force and surface characterization in a high throughput manner. Investigations of the feasibility of combining tapping mode (TM) AFM and pulsed-force mode (PFM) AFM with an inverted AFM (i-AFM) design were carried out. Conventional AFM requires a cantilever with an integrated tip to image a substrate-supported sample, whereas i-AFM, uses one of tens of thousands of substrate-supported tips to image a cantilever-supported sample. Microcontact printed and dip-pen nanolithographyically modified silicon chip and tipless cantilevers were characterized by both conventional and inverted AFM in contact mode (CM), TM, force volume (FV) and PFM.

ISBN: 9780494091371Subjects--Topical Terms:

1021807
Chemistry, General.

Adaptation of intermittent contact modes to inverted atomic force microscopy.
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245 1 0 $a Adaptation of intermittent contact modes to inverted atomic force microscopy.
300 $a 104 p.
500 $a Source: Masters Abstracts International, Volume: 44-03, page: 1363.
502 $a Thesis (M.Sc.)--University of Alberta (Canada), 2005.
520 $a This work is aimed at evaluating the plausibility of using atomic force microcopy (AFM) instrumentation and techniques for the measurement of interaction force and surface characterization in a high throughput manner. Investigations of the feasibility of combining tapping mode (TM) AFM and pulsed-force mode (PFM) AFM with an inverted AFM (i-AFM) design were carried out. Conventional AFM requires a cantilever with an integrated tip to image a substrate-supported sample, whereas i-AFM, uses one of tens of thousands of substrate-supported tips to image a cantilever-supported sample. Microcontact printed and dip-pen nanolithographyically modified silicon chip and tipless cantilevers were characterized by both conventional and inverted AFM in contact mode (CM), TM, force volume (FV) and PFM.
520 $a We have demonstrated for the first time that iTM-AFM and iPFM-AFM are capable of differentiating chemical heterogeneity of a patterned surface by phase contrast and adhesive force measurement, respectively.
590 $a School code: 0351.
650 4 $a Chemistry, General. $3 1021807
650 4 $a Chemistry, Physical. $3 560527
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