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Analog signal generation for built-i...
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Lu, Albert K., (1969-)
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Analog signal generation for built-in-self-test of mixed-signal integrated circuits /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
正題名/作者:
Analog signal generation for built-in-self-test of mixed-signal integrated circuits // by Gordon W. Roberts, Albert K. Lu.
作者:
Roberts, Gordon W.,
其他作者:
Lu, Albert K.,
出版者:
Boston :Kluwer Academic Publishers, : c1995.,
面頁冊數:
viii, 122 p. :ill. ;25 cm.
標題:
Integrated circuits - Design and construction. -
ISBN:
0792395646 (acid-free paper)
Analog signal generation for built-in-self-test of mixed-signal integrated circuits /
Roberts, Gordon W.,1959-
Analog signal generation for built-in-self-test of mixed-signal integrated circuits /
by Gordon W. Roberts, Albert K. Lu. - Boston :Kluwer Academic Publishers,c1995. - viii, 122 p. :ill. ;25 cm. - The Kluwer international series in engineering and computer science ;SECS 312.. - Kluwer.
Includes bibliographical references (p. 117-119) and index.
ISBN: 0792395646 (acid-free paper)
LCCN: 95000989Subjects--Topical Terms:
658490
Integrated circuits
--Design and construction.
LC Class. No.: TK7872.S5 / R63 1995
Dewey Class. No.: 621.3815/48
Analog signal generation for built-in-self-test of mixed-signal integrated circuits /
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