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Computer storage devices - Testing.
概要
作品:
3 作品在 1 項出版品 1 種語言
書目資訊
High performance memory testing = design principles, fault modeling, and self-test /
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(書目-電子資源)
High performance memory testing = design principles, fault modeling, and self-test /
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(書目-語言資料,印刷品)
Multi-run memory tests for pattern sensitive faults
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(書目-電子資源)
主題
Computer storage devices- Testing.
Electronics and Microelectronics, Instrumentation.
Processor Architectures.
Circuits and Systems.
Semiconductor storage devices- Testing.
Engineering.
Random access memory- Testing.
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