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Random access memory - Testing.
概要
作品:
2 作品在 1 項出版品 1 種語言
書目資訊
Advanced test methods for SRAMs = effective solutions for dynamic fault detection in nanoscaled technologies /
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(書目-語言資料,印刷品)
Multi-run memory tests for pattern sensitive faults
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(書目-電子資源)
主題
Computer storage devices- Testing.
Electronics and Microelectronics, Instrumentation.
Computer-Aided Engineering (CAD, CAE) and Design.
Processor Architectures.
Circuits and Systems.
Semiconductor storage devices- Testing.
Engineering.
Random access memory- Testing.
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