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Mrozek, Ireneusz.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

Multi-run memory tests for pattern sensitive faults by: Mrozek, Ireneusz.; SpringerLink (Online service) (Electronic resources)

Subjects

Computer storage devices- Testing. Electronics and Microelectronics, Instrumentation. Processor Architectures. Circuits and Systems. Semiconductor storage devices- Testing. Engineering. Random access memory- Testing.

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