Franco, Manuel Uriel.
概要
作品: | 1 作品在 0 項出版品 0 種語言 |
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書目資訊
Modeling the Effects of Ion Strike Displacement Damage on the 3D Reciprocal Space of Silicon.
by:
Franco, Manuel Uriel.; Rensselaer Polytechnic Institute., Nuclear Engineering.
(書目-電子資源)