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Egerton, R.F.

Overview

Works:	0 works in 1 publications in 1 languages

Titles

Physical principles of electron microscopy = an introduction to TEM, SEM, and AEM / by: Egerton, R.F.; SpringerLink (Online service) (Electronic resources)

Subjects

Nanotechnology. Electron microscopy. Spectroscopy and Microscopy. Materials Science. Characterization and Evaluation of Materials. Biological Microscopy.

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